量子点
退火(玻璃)
光致发光
材料科学
光电子学
图层(电子)
凝聚态物理
封面(代数)
纳米技术
复合材料
物理
机械工程
工程类
作者
Shigekazu Okumura,Kazuki Fujisawa,Tamami Naruke,Kenichi Nishi,Yutaka Onishi,Keizo Takemasa,Mitsuru Sugawara,Masakazu Sugiyama
标识
DOI:10.35848/1347-4065/ac7caa
摘要
Abstract The effect of low-temperature InGaAs/GaAs cover layer growth of InAs quantum dots on their optical and structural properties was investigated. Photoluminescence intensity depended heavily on the growth temperature and thickness of the low-temperature cover layer and decreased as the number of dislocations formed directly above InAs quantum dots increased. These dislocations are formed at the initial stage of high-temperature GaAs growth, originating from pits that remain on the surface after the growth of the low-temperature cover layer and subsequent annealing. To ensure a high-quality InAs quantum dot structure free from dislocations, it is important to obtain a highly flat surface with suppressed pits after low-temperature cover layer growth and subsequent annealing.
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