六甲基二硅氧烷
等离子体
聚合物
薄膜
多孔性
电解质
材料科学
化学工程
等离子体聚合
等离子体电解氧化
等离子体刻蚀
冷凝
高分子化学
蚀刻(微加工)
化学
物理化学
纳米技术
复合材料
单体
图层(电子)
电极
工程类
物理
热力学
量子力学
作者
Xiaofan Xie,Teresa de los Arcos,Guido Grundmeier
标识
DOI:10.1002/ppap.202200052
摘要
Abstract The presented study compares the structure of hexamethyldisiloxane (HMDSO) and hexamethyldisilazane (HMDSN) plasma polymer thin films with a thickness of about 30 nm before and after a plasma oxidation process, focusing on the analysis of porosity and the correlated electrolyte up‐take in the formed films. The results illustrate that the plasma oxidation treatment converts the HMDSO and HMDSN plasma polymer films progressively into SiO x ‐like films. However, the underlying mechanism of the etching of C x H y groups and the condensation of intermediate Si‐OH groups leads to highly porous films. The studies show that the differences in the chemical structure and nanoporosity as measured by spectroscopic techniques could be correlated with the resulting up‐take of electrolytes in the open pores of the films.
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