硫系化合物
衰减系数
材料科学
吸收(声学)
吸收光谱法
传输(电信)
光学
硫系玻璃
波长
透射系数
曲线拟合
薄膜
谱线
折射率
光电子学
分子物理学
化学
数学
物理
电信
计算机科学
纳米技术
统计
复合材料
天文
作者
A. Meshalkin,Olexandr Paiuk,E. Achimova,Alexander V. Stronski
出处
期刊:Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX
日期:2018-12-31
卷期号:: 124-124
摘要
An curve-fitting method for accurate determination of optical constants and thickness is presented for chalcogenide glasses thin films. Optical constants and thickness of nanomultilayer chalcogenide structure As2S3:Mn-Se were obtained by Swanepoel method from transmission spectrum using PARAV software. Proposed curve-fitting method is based on numerical simulation of transmission spectrum based on film parameters obtained by Swanepoel method and comparison one with experimental transmission spectrum. It is shown that modeled spectrum is not fully corresponding to the original measured spectrum due to inaccurate absorption coefficient determination in the region of Urbach absorption. Adjusting of absorption spectrum with further numerical simulation of spectrum allows achieving the best correspondence to original transmission spectrum. It solves the problem of the accurate absorption coefficient calculation in the different absorption regions. Finally, dependencies of the absorption coefficient on wavelength of the nanomultilayer chalcogenide films structures were obtained from transmission spectra using the proposed method.
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