轮廓仪
干涉测量
计量学
干扰(通信)
计算机科学
航程(航空)
领域(数学)
算法
选择(遗传算法)
过程(计算)
集合(抽象数据类型)
光学
物理
数学
人工智能
电信
材料科学
表面粗糙度
操作系统
频道(广播)
复合材料
量子力学
程序设计语言
纯数学
作者
Catherine E. Towers,David P. Towers,J.D.C. Jones
标识
DOI:10.1016/j.optlaseng.2004.08.005
摘要
We present novel algorithms using multi-frequency analysis for full-field profilometry. The technique provides absolute order of interference in an interferogram. The process is based on an optimisation criterion to utilise the minimum number of projected fringe frequencies to give the largest possible measurement dynamic range. The algorithms presented have been generalised for n frequencies. A set of solutions for three-frequency interferometry is presented that satisfies the optimisation criterion. Results are presented for 3 projected fringe frequencies and we demonstrate by simulation that the approach is indeed optimal. The algorithms given are generic and are equally applicable to any metrological measurement using interferometry.
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