开尔文探针力显微镜
原子力显微镜
原子单位
曲面(拓扑)
显微镜
比例(比率)
材料科学
分析化学(期刊)
纳米技术
物理
化学
几何学
光学
数学
量子力学
色谱法
作者
Georg H. Enevoldsen,Thilo Glatzel,Mona C. Christensen,Jeppe V. Lauritsen,Flemming Besenbacher
标识
DOI:10.1103/physrevlett.100.236104
摘要
From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.
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