光电流
极化
材料科学
肖特基势垒
光电效应
极化(电化学)
铁电性
肖特基二极管
光电子学
电场
光电导性
薄膜
纳米技术
电介质
化学
二极管
物理化学
物理
量子力学
作者
Fengang Zheng,Jie Xu,Liang Fang,Mingrong Shen,Xinglong Wu
摘要
Photoelectric behavior of Pt sandwiched Pb(Zr0.20Ti0.80)TiO3 (PZT) films deposited on Pt∕Ti∕SiO2∕Si substrates by a sol-gel method was investigated by testing the short-circuit photocurrent under different film thicknesses. By poling the films step by step with increased magnitude and alternated direction of the dc electric field, interesting photoelectric behavior was found when the PZT films were in virgin or poled up/down state. The photocurrent was also strongly dependent on the film thickness. A simple model was proposed to separate the effects of interface Schottky barriers and bulk ferroelectric polarization of the film on the photocurrent of the Pt/PZT/Pt structure.
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