比较器
逐次逼近ADC
CMOS芯片
有效位数
功勋
噪音(视频)
电子工程
奈奎斯特-香农抽样定理
计算机科学
奈奎斯特率
电压
采样(信号处理)
噪声整形
线性
电气工程
工程类
人工智能
探测器
电信
图像(数学)
计算机视觉
作者
Chen-Che Kao,S. T. Hsieh,Chih-Cheng Hsieh
标识
DOI:10.1109/asscc.2017.8240254
摘要
This paper presents a low voltage and power efficient 12-bit successive-approximation register (SAR) analog-to-digital converter (ADC). The proposed adaptive time-domain (ATD) comparator automatically adjusts its input-referred noise performance according to the intermediate residual input level (ΔV in ) during conversion. Considering the noise requirement of 12-bit SAR ADC, the proposed implementation effectively reduces the comparator power consumption by 50% compared with the conventional approach. The prototyped ADC is fabricated in 90nm CMOS technology with a core area of 0.109mm 2 . At 0.5 V supply voltage and 150-to-250kS/s sampling rate with a Nyquist input, the implemented ADC achieves a SNDR of 63.8 to 66.3 dB with a corresponding ENOB of 10.3 to 10.71 bits. The resulting figure-of-merit (FoM) are 4.52 to 4.82 fJ/conversion-step.
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