IN SITU STUDIES OF THE PROPERTIES OF MATERIALS UNDER HIGH-PRESSURE AND TEMPERATURE CONDITIONS USING MULTI-ANVIL APPARATUS AND SYNCHROTRON X-RAYS

▪ Abstract Increased access to multi-anvil high-pressure devices interfaced to synchrotron X-ray radiation sources has led to a new class of experiments. These new capabilities include (a) high-precision crystal structure determination and refinement from powder X-ray diffraction data; (b) the determination of kinetic parameters and structure from time-resolved diffraction data; (c) the determination of absolute pressures by the combined use of ultrasonic techniques at high pressures and temperatures with simultaneous monitoring of X-ray diffraction; and (d) the determination of the strength and rheological properties of materials through the monitoring of the relaxation of broadened diffraction peak widths in the presence of a well-characterized deviatoric stress field generated in the multi-anvil high-pressure apparatus.