半导体
兴奋剂
材料科学
光电子学
异质结
纳米技术
CMOS芯片
电子迁移率
数码产品
电气工程
工程类
作者
Guitian Qiu,Lingan Kong,Mengjiao Han,Qian Zhang,Majeed Ur Rehman,Jianxian Yi,Lede Xian,Xiankai Lin,Aumber Abbas,Jiwei Chen,Yingjie Luo,Wenbo Li,Zhongchao Wei,Hongyun Meng,Xiuliang Ma,Qijie Liang
标识
DOI:10.1002/advs.202408634
摘要
Abstract 2D semiconductors show promise as a competitive candidate for developing future integrated circuits due to their immunity to short‐channel effects and high carrier mobility at atomic layer thicknesses. The inherent defects and Fermi level pinning effect lead to n‐type transport characteristics in most 2D semiconductors, while unstable and unsustainable p‐type doping by various strategies hinders their application in many areas, such as complementary metal‐oxide‐semiconductor (CMOS) devices. In this study, an intralayer/interlayer codoping strategy is introduced that stabilizes p‐type doping in 2D semiconductors. By incorporating oppositely charged ions (F and Li) with the intralayer/interlayer of 2D semiconductors, remarkable p‐type doping in WSe 2 and MoTe 2 with air stability up to 9 months is achieved. Notably, the hole mobility presents a 100‐fold enhancement (0.7 to 92 cm 2 V −1 s −1 ) with the codoping procedure. Structural and elemental characterizations, combined with theoretical calculations validate the codoping mechanism. Moreover, a CMOS inverter and more complex logic functions such as NOR and XNOR, as well as large‐area device arrays are demonstrated to showcase its applications and scalability. These findings suggest that stable and straightforward intralayer/interlayer codoping strategy with charge‐space synergy holds the key to unlocking the potential of 2D semiconductors in complex and scalable device applications.
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