电阻率和电导率
材料科学
氢氧化物
浸涂
沉积(地质)
薄膜
基质(水族馆)
兴奋剂
氧化物
铝
异质结
电化学
化学工程
涂层
电极
矿物学
无机化学
复合材料
纳米技术
冶金
化学
光电子学
电气工程
地质学
物理化学
生物
沉积物
工程类
古生物学
海洋学
作者
M. Ichimura,Cheng Baixian,Tong Li
标识
DOI:10.35848/1347-4065/ad1423
摘要
Abstract Aluminum oxide-hydroxide thin films are fabricated by a simple chemical process, dip-dry deposition. The substrate is dipped in the solution and then dried on a heater plate. The dip-dry cycles are repeated to obtain necessary thickness. The deposition solution contains Al 2 (SO 4 ) 3 and NH 4 OH. To control resistivity of the films, Mg is doped by immersing the samples in a Mg(NO 3 ) 2 solution. The resistivity is reduced by the doping, and is about 10 4 Ωcm in the thickness direction. Thus the deposited films would be useful for interface layers in heterostructures and coating of electrodes in electrochemical systems.
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