外延
材料科学
光电子学
工程物理
纳米技术
工程类
图层(电子)
作者
Yu. B. Bolkhovityanov,O. P. Pchelyakov
出处
期刊:Physics-Uspekhi
[Institute of Physics]
日期:2008-05-31
卷期号:51 (5): 437-456
被引量:234
标识
DOI:10.1070/pu2008v051n05abeh006529
摘要
While silicon and gallium arsenide are dominant materials in modern micro- and nanoelectronics, devices fabricated from them still use Si and GaAs substrates only separately. Integrating these materials on the (highest effeciency) substrate of Si has been the subject of much research effort for more than twenty years. This review systematizes and generalizes the current understanding of the fundamental physical mechanisms governing the epitaxial growth of GaAs and its related III–V compounds on Si substrates. Basic techniques avilable for improving the quality of such heterostructures are described, and recent advances in fabricating device-quality AIIIBV/Si heterostructures and devices on their bases are also presented.
科研通智能强力驱动
Strongly Powered by AbleSci AI