Flexible Dual‐Gate Organic Field‐Effect Transistors for Pressure Sensing

有机场效应晶体管 材料科学 压电 光电子学 晶体管 电压 场效应晶体管 阈值电压 压力传感器 聚萘二甲酸乙二醇酯 图层(电子) 电气工程 纳米技术 复合材料 物理 热力学 工程类
作者
Heisuke Sakai,Olamikunle Osinimu Ogunleye,Hideyuki Murata
标识
DOI:10.1002/9783527834266.ch30
摘要

The development of sensors based on organic field-effect transistors (OFETs) for use in flexible sensors has attracted research interest. The research targets include OFET-based low-voltage sensors capable of highly sensitive detection of chemical or physical signals. Here, we developed a flexible pressure sensor based on flexible OFETs. The low-voltage (−5 V) dual-gate OFET operates by strongly modulating the drain current ( I D ) using a novel device architecture composed of a piezoelectric sensing layer and a low-voltage OFET readout. Dual-gate OFET-based pressure sensors consist of a pressure sensing element made of piezoelectric poly(vinylidenefluoride-trifluoroethylene) [P(VDF-TrFE)] and a low-voltage OFET readout. The pressure-induced response of I D , which is due to the depletion of charge carriers accumulated in the channel of the OFET, depends on the magnitude of the pressure load. This response indicates that a voltage is generated in the piezoelectric P(VDF-TrFE) layer by the application of pressure, which causes a shift in the threshold voltage ( V TH ). The magnitude of the generated voltage is derived as the magnitude of the V TH shift, and then the piezoelectric constant d 33 of the piezoelectric P(VDF-TrFE) layer is derived. As the d 33 value is in good agreement with that obtained by direct measurement, the operation mechanism of the dual-gate OFET-based pressure sensor is identified as the piezoelectric behavior of the P(VDF-TrFE) layer. A flexible dual-gate OFET-based pressure sensor that employs a thin polyethylene naphthalate (PEN, 25 μm) film as a substrate is also introduced. Because the substrate is flexible, the pressure response of the device on a curved surface was observed. The performance was equivalent to that of a device fabricated on a glass substrate. I D varied in response to a pressure load even without the application of the gate voltage. The magnitude of the change in I D in response to the applied pressure was approximately 2.5 times that of the device on the glass substrate.

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