紫外线
光电探测器
材料科学
光电子学
异质结
偏压
半导体
图层(电子)
电压
物理
纳米技术
量子力学
作者
Lechen Yang,Kai Fu,Min Xiong,Haijun Li,Wenhua Shi,Baoshun Zhang
标识
DOI:10.1166/jno.2023.3426
摘要
A solar-blind ultraviolet metal-semiconductor-metal photodetector based on dual-color AlGaN/GaN heterostructure was fabricated and tested. The device showed good photo-response in solar-blind ultraviolet, by employing a single AlGaN/GaN layer. Spectrum responses of the photodetector were investigated by changing the frequency of incident light signals and the bias voltages. The peak response was 0.288 A/W at 260 nm and 0.322 A/W at 366 nm at the bias of 5 V.
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