吸收率
微测辐射热计
材料科学
锡
热辐射计
光电子学
氮化钛
吸收(声学)
薄膜
光学
氮化物
图层(电子)
复合材料
纳米技术
探测器
反射率
物理
冶金
作者
Ting S. Luk,Guangping Xu,Willard Ross,John Nogan,Ethan A. Scott,Sergei A. Ivanov,Oana Niculescu,Oleg Mitrofanov,Charles Thomas Harris
摘要
Ultrathin light absorbers present a viable route toward improving the specific detectivity and response time of microbolometers. However, for an ultrathin film to absorb light efficiently, the dielectric function of the film and its thickness must satisfy strict requirements. We experimentally demonstrate an average absorptance of 48% ± 2.5% in the 8–13 μm (769–1250 cm−1) spectral range for 10 nm thick titanium nitride (TiN), a value bordering on the 50% fundamental absorptance limit for a suspended thin film. The heat capacity per unit area of this absorber is only 1.2 × 10−6 J/K/cm2, which is beneficial for improving the response time of a microfabricated bolometer. We also show that a sufficient condition for reaching maximal absorption in an ultrathin film is that ε″ ≫ |ε′|.
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