硅
微电子机械系统
各向异性
杨氏模量
模数
计算机科学
弹性(物理)
机械工程
材料科学
纳米技术
复合材料
物理
工程类
光电子学
光学
作者
Matthew A. Hopcroft,William D. Nix,Thomas W. Kenny
标识
DOI:10.1109/jmems.2009.2039697
摘要
The Young's modulus ( E ) of a material is a key parameter for mechanical engineering design. Silicon, the most common single material used in microelectromechanical systems (MEMS), is an anisotropic crystalline material whose material properties depend on orientation relative to the crystal lattice. This fact means that the correct value of E for analyzing two different designs in silicon may differ by up to 45%. However, perhaps, because of the perceived complexity of the subject, many researchers oversimplify silicon elastic behavior and use inaccurate values for design and analysis. This paper presents the best known elasticity data for silicon, both in depth and in a summary form, so that it may be readily accessible to MEMS designers.
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