纳米
材料科学
CMOS芯片
碳纳米管
晶体管
碳纳米管场效应晶体管
光电子学
纳米技术
石墨烯
阈下传导
硅
半导体
逆变器
MOSFET
缩放比例
场效应晶体管
电压
电气工程
复合材料
工程类
数学
几何学
作者
Chenguang Qiu,Zhiyong Zhang,Mengmeng Xiao,Yingjun Yang,Donglai Zhong,Lian‐Mao Peng
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2017-01-19
卷期号:355 (6322): 271-276
被引量:719
标识
DOI:10.1126/science.aaj1628
摘要
High-performance top-gated carbon nanotube field-effect transistors (CNT FETs) with a gate length of 5 nanometers can be fabricated that perform better than silicon complementary metal-oxide semiconductor (CMOS) FETs at the same scale. A scaling trend study revealed that the scaled CNT-based devices, which use graphene contacts, can operate much faster and at much lower supply voltage (0.4 versus 0.7 volts) and with much smaller subthreshold slope (typically 73 millivolts per decade). The 5-nanometer CNT FETs approached the quantum limit of FETs by using only one electron per switching operation. In addition, the contact length of the CNT CMOS devices was also scaled down to 25 nanometers, and a CMOS inverter with a total pitch size of 240 nanometers was also demonstrated.
科研通智能强力驱动
Strongly Powered by AbleSci AI