衰减全反射
全内反射
折射率
光学
谱线
棱镜
椭圆偏振法
光谱学
红外光谱学
入射角(光学)
极化(电化学)
折射
红外线的
反射(计算机编程)
材料科学
化学
物理
薄膜
有机化学
量子力学
计算机科学
程序设计语言
物理化学
天文
纳米技术
作者
Thomas G. Mayerhöfer,William D. P. Costa,Jürgen Popp
标识
DOI:10.1177/00037028241283050
摘要
We have specified and obtained a ZnSe prism with an unconventional face angle cut to 30°. This prism, with internal incidence angles ranging from 30° to 48°, allows users to record internal reflection spectra below the critical angle and attenuated total reflection (ATR) spectra above the critical angle without the need to change optics or move or replace the sample. We demonstrate its capabilities using 102 spectra of benzyl benzoate taken with s- and p-polarization at different angles of incidence. The subcritical spectra were analyzed to obtain n ∞ , a key parameter for correcting the ATR spectra. These corrected spectra were subsequently used to determine the complex refractive index for all ATR measurements. The averaged complex refractive index function shows excellent agreement with that obtained through ATR spectroscopic ellipsometry.
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