量子效率
异质结
非晶硅
光电子学
材料科学
硅
太阳能电池
聚合物太阳能电池
氧化铟锡
兴奋剂
短路
电流密度
暗电流
图层(电子)
晶体硅
物理
纳米技术
电压
光电探测器
量子力学
作者
Zachary C. Holman,Antoine Descoeudres,Loris Barraud,Fernando Zicarelli Fernandez,Johannes P. Seif,Stefaan De Wolf,Christophe Ballif
标识
DOI:10.1109/jphotov.2011.2174967
摘要
The current losses due to parasitic absorption in the indium tin oxide (ITO) and amorphous silicon (a-Si:H) layers at the front of silicon heterojunction solar cells are isolated and quantified. Quantum efficiency spectra of cells in which select layers are omitted reveal that the collection efficiency of carriers generated in the ITO and doped a-Si:H layers is zero, and only 30% of light absorbed in the intrinsic a-Si:H layer contributes to the short-circuit current. Using the optical constants of each layer acquired from ellipsometry as inputs in a model, the quantum efficiency and short-wavelength current loss of a heterojunction cell with arbitrary a-Si:H layer thicknesses and arbitrary ITO doping can be correctly predicted. A 4 cm 2 solar cell in which these parameters have been optimized exhibits a short-circuit current density of 38.1 mA/cm 2 and an efficiency of 20.8%.
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