饱和速度
速度饱和
凝聚态物理
漂移速度
碳纳米管
电子迁移率
电场
材料科学
费米能级
电子
电压
晶体管
纳米技术
物理
MOSFET
量子力学
作者
Vasili Perebeinos,J. Tersoff,Phaedon Avouris
出处
期刊:Nano Letters
[American Chemical Society]
日期:2006-01-07
卷期号:6 (2): 205-208
被引量:56
摘要
Carbon nanotube field-effect transistors operate over a wide range of electron or hole density, controlled by the gate voltage. Here we calculate the mobility in semiconducting nanotubes as a function of carrier density and electric field, for different tube diameters and temperatures. The low-field mobility is a nonmonotonic function of carrier density and varies by as much as a factor of 4 at room temperature. At low density, with increasing field the drift velocity reaches a maximum and then exhibits negative differential mobility, due to the non-parabolicity of the band structure. At a critical density, rho(c) approximately 0.35-0.5 electrons/nm, the drift velocity saturates at around one-third of the Fermi velocity. Above rho(c), the velocity increases with field strength with no apparent saturation.
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