High resolution optical time domain reflectometry for integrated optics
作者
W. Hodel,P. Beaud,Jürg A. Schütz,H. P. Weber
标识
DOI:10.1364/ofc.1990.wi1
摘要
Optical time domain reflectometry (OTDR) is a well known method for the diagnostics of fiber optic systems. For the characterization of integrated optical structures with typical dimensions of only a few millimeters, however, the spatial resolution and dynamic range of a standard OTDR system are insufficient. The successful operation of a high resolution OTDR system crucially depends on the choice of the light source and detection technique.