XNOR门
计算机科学
晶体管
备用电源
逻辑门
电子线路
功率延迟产品
碳纳米管场效应晶体管
材料科学
电气工程
电子工程
场效应晶体管
工程类
与非门
电压
算法
作者
Milad Tanavardi Nasab,Abdolah Amirany,Mohammad Hossein Moaiyeri,Kian Jafari
出处
期刊:IEEE Magnetics Letters
[Institute of Electrical and Electronics Engineers]
日期:2024-01-01
卷期号:15: 1-5
被引量:10
标识
DOI:10.1109/lmag.2024.3356815
摘要
This paper proposes an SEU-hardened task-scheduling logic in memory XNOR/XOR neuron and synapse circuits. Using C-element and magnetic tunnel junction enhances immunity against single event upset injection to the design. Also, using logic in memory architecture eliminates the need to access external memory and decreases power and delay. Furthermore, using the carbon nanotube field-effect transistor leads to lower leakage and static current caused by higher gate control in these transistors. Compared to the state-of-the-art counterparts, the proposed design offers at least 31%, 17%, and 3% improvement regarding power, power delay product, and power delay area product
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