光学接近校正
计算机科学
图形处理单元
进程窗口
架空(工程)
过程(计算)
平版印刷术
加速
工艺变化
趋同(经济学)
算法
集合(抽象数据类型)
计算机工程
并行计算
操作系统
艺术
视觉艺术
经济
程序设计语言
经济增长
作者
Ziyang Yu,Guojin Chen,Yuzhe Ma,Bei Yu
标识
DOI:10.1109/tcad.2022.3175939
摘要
As the feature size of advanced integrated circuits keeps shrinking, resolution enhancement techniques (RETs) are utilized to improve the printability in the lithography process. Optical proximity correction (OPC) is one of the most widely used RETs aiming at compensating the mask to generate a more precise wafer image. In this article, we put forward a level-set-based OPC approach with high mask optimization quality and fast convergence. In order to suppress the disturbance of the condition fluctuation in the lithography process, we propose a new process window-aware cost function. Then, a novel momentum-based evolution technique is adopted, which demonstrates substantial improvement. We also propose a self-adaptive conjugate gradient method that promises a higher optimization stability and less consuming time. Moreover, the graphics processing unit (GPU) is leveraged for accelerating the proposed algorithm. We take the output masks from a machine learning-based mask optimization flow as the input and work as the postprocess to refine the quasi-optimized masks. Experimental results on ICCAD 2013 benchmarks show that our algorithm outperforms all previous OPC algorithms in both solution quality and runtime overhead.
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