磁阻随机存取存储器
隧道磁电阻
磁电阻
计算机科学
缩放比例
随机存取存储器
旋转扭矩传递
磁存储器
电气工程
扭矩
非易失性存储器
功率(物理)
电子工程
工程类
计算机硬件
材料科学
图层(电子)
物理
磁场
纳米技术
磁化
操作系统
热力学
量子力学
数学
几何学
作者
S. Ikegawa,F. B. Mancoff,J. Janesky,S. Aggarwal
标识
DOI:10.1109/ted.2020.2965403
摘要
Magnetoresistive random access memory (MRAM) is regarded as a reliable persistent memory technology because of its long data retention and robust endurance. Initial MRAM products utilized toggle mode writing of a balanced synthetic antiferromagnet (SAF) free layer to overcome problems with half-selected bits that challenged traditional Stoner-Wohlfarth switching. With the development of spin transfer torque (STT) switching in perpendicular magnetic tunnel junctions, the capability for scaling MRAM products increased markedly, enabling a 1-Gb device in 2019. Ongoing research will allow scaling to even higher capacities. Compared to traditional memories, STT-MRAM can save power, improve performance, and enhance system data integrity, which supports the growing computing demands for everything from data centers to Internet of Things (IoT) devices. This article provides a review of the technology that enabled present toggle and STT-MRAM products, future STT-MRAM products, and new MRAM technologies beyond STT.
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