扫描电子显微镜
抓住
纳米技术
微电子
工程物理
材料科学
工程类
复合材料
软件工程
出处
期刊:实验科学与技术
日期:2019-10-28
卷期号:17 (5): 85-93
被引量:2
标识
DOI:10.3969/j.issn.1672-4550.2019.05.019
摘要
The scanning electron microscopy (SEM) is mainly used for the observation and analysis of morphology, structure, and composition of samples. The SEM possesses advantages in resolution, depth of field and ease of operation. It plays an important role and is widely used in materials, physics, chemistry, biology, geology, archaeology, microelectronics industry, etc. Based on our experience of operating the SEM, this paper introduces the fundamental principle, construction, advantages, and applications of the SEM, which is helpful for the SEM learner and operator to grasp and use the SEM.
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