作者
Sriram Vijayan,Mark Aindow,Joerg R. Jinschek,Stephan Kujawa,Jens Greiser
摘要
Journal Article TEM Specimen Preparation for In Situ Heating Experiments Using FIB Get access Sriram Vijayan, Sriram Vijayan Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Mark Aindow, Mark Aindow Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA Search for other works by this author on: Oxford Academic Google Scholar Joerg R Jinschek, Joerg R Jinschek FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Stephan Kujawa, Stephan Kujawa FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Jens Greiser Jens Greiser FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 294–295, https://doi.org/10.1017/S143192761700215X Published: 04 August 2017