散射
谢乐方程
入射(几何)
光学
粒度
探测器
光束线
物理
限制
材料科学
衍射
工程类
梁(结构)
机械工程
冶金
标识
DOI:10.1107/s0021889809040126
摘要
Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X-ray scattering. Various aspects of Scherrer-type grain-size analysis are discussed with regard to the characterization of thin films with grazing-incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution-limiting factors in grazing-incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.
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