PSP-SOI: A Surface Potential Based Compact Model of Partially Depleted SOI MOSFETs
作者
Weimin Wu,X. Li,G. Gildenblat,G.O. Workman,S. Veeraraghavan,Colin C. McAndrew,R. van Langevelde,G.D.J. Smit,A.J. Scholten,D.B.M. Klaassen,Josef Watts
标识
DOI:10.1109/cicc.2007.4405678
摘要
This paper reports recent progress on partially depleted (PD) SOI modeling using a surface potential based approach. The new model, called PSP-SOI, is formulated within the framework of the latest industry standard bulk MOSFET model PSP. In addition to its physics-based formulation and scalability inherited from PSP, PSP-SOI captures SOI specific effects by including a floating body simulation capability, a parasitic bipolar model, and self-heating. A nonlinear body resistance is included for modeling body-contacted SOI devices. The PSP-SOI model has been extensively tested on several PD/SOI technologies.