化学
硫族元素
金属有机骨架
电导率
电阻率和电导率
金属
纳米技术
无机化学
物理化学
有机化学
吸附
材料科学
电气工程
工程类
作者
Mingyu Yang,Junjun Tan,Ziping Wang,Dehu Li,Wu Xu,Hong Wang,Long Yuan,Chao Yang,Zheng Meng
摘要
Establishing effective strategies to impart electrical conductivity to metal-organic frameworks (MOFs) provides new opportunities for advancing research in electronic materials. In this study, we develop a heavy chalcogen incorporation strategy by constructing a new family of isoreticular two-dimensional conductive MOFs, Cu-X-HHS, through the interconnection of Cu ions with three hexahydroxysumanene (HHS) ligands which are embedded chalcogen (X) atoms, including sulfur (S), selenium (Se), and tellurium (Te). Cu-X-HHS MOFs have an infinitely extended wavy and honeycomb network structure. A substantial enhancement in electrical conductivity is observed with increasing atomic number of the incorporated chalcogenides, among which Cu-Te-HHS exhibits an impressive room temperature conductivity of 3.21 S cm-1, 10,000 times higher than the S-containing analog. Mechanism study reveals that the chalcogen atoms with gradually decreased electronegativity and increased atomic radii affect the frontier orbital matching between the ligand and the Cu ions, as well as the interlayer interaction in the Cu-X-HHS MOFs.
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