方向错误
电子背散射衍射
材料科学
打滑(空气动力学)
扫描电子显微镜
极限抗拉强度
拉伸试验
晶界
复合材料
格子(音乐)
合金
衍射
冶金
结晶学
光学
微观结构
化学
热力学
物理
声学
作者
Hao Wang,Haoyi Niu,Hao Wu,Rengeng Li,Guohua Fan
出处
期刊:Materials
[MDPI AG]
日期:2022-04-14
卷期号:15 (8): 2891-2891
被引量:2
摘要
An in situ tensile test of the ring-rolled GH4169 alloy is performed to investigate the plastic deformation behavior at the micro level. Slip system activations are identified by slip traces captured by a scanning electron microscope and lattice orientation data acquired by electron backscattered diffraction. Our results demonstrated that the fraction of low-angle grain boundaries gradually increased upon tensile deformation, and the misorientation evolution in the grain interior was severely inhomogeneous. The Schmid factors at the grains of interest are calculated for comparison with the actual activated slip systems. Most of the slip system activation coincides with the Schmid law, as opposed to the initiation of other potential slip systems at some grains.
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