Spectral Inverse Study of Stacked Leaf Chlorophyll Concentration in Wheat

The study on relationship between stacked wheat leaves chlorophyll concentration and hyperspectral reflectance is an important technical approach to develop spectral inverse array of leaf chlorophyll concentration from labrotry leaf level to field canopy level.This paper studied the response characteristics of 350~2 500 nm reflectance spectra and 4 common vegetation indices on foliar chlorophyll concentration based on single layer and stacked multi-layers wheat leaves.The results showed that leaf spectral reflectance at the green reflecting peak region around 550 nm and red region around 705 nm had the best relation with chlorophyll concentration.Red position showed blue-shift with the increase of chlorophyll concentration.The effect of commonly used vegetation index NDVI was not ideal in monitoring leaf chlorophyll concentration in this study.SR705 could not estimate leaf chlorophyll concentration when leaves were stacked in different layers,although which closely related to single leaf chlorophyll concentration.Among four vegetation indices used in this study,TCARI had the best prediction power of chlorophyll concentration to both single layer and multi-layers wheat leaves,and it could be further used to estimate photosynthetic charactristic.