干扰(通信)
计算机科学
可转让性
样品(材料)
特征(语言学)
干涉测量
人工智能
一般化
光学
棱锥(几何)
计算机视觉
曲面(拓扑)
模式识别(心理学)
水准点(测量)
空间频率
算法
推论
人工神经网络
相(物质)
目标检测
融合
职位(财务)
特征提取
图像处理
作者
Zili Lei,Zuozhuang Xie,Da Liu,Jian Li,zhai zhongsheng
出处
期刊:Applied Optics
[The Optical Society]
日期:2026-01-02
卷期号:65 (4): 1152-1152
摘要
In white-light interferometry (WLI) for surface topography measurement, the width of interference fringes directly reflects the surface information of the sample under test. Operators rely on this to adjust the sample posture for high-precision measurements. Consequently, there is an urgent need to develop a technique capable of rapidly locating the central region of white-light interference fringes. This study proposes a fast detection method based on an improved YOLOv5 model. Leveraging YOLOv5’s fast inference capability, the method efficiently locates the central fringe region. Enhancements are introduced through the incorporation of a coordinate attention (CA) module and a weighted bidirectional feature pyramid network (BiFPN), achieving superior feature fusion and strengthening the model’s ability to detect fringes of varying sizes. Compared to the original YOLOv5 model, the mean average precision (mAP) of the improved model increased from 72.1% to 82.8%. The experimental results indicate that the method can quickly and accurately detect white-light interference fringes, showing strong transferability and generalization ability in different instruments and complex scenarios, thus providing the possibility for real-time detection.
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