Linking the technological regime to the technological catch-up: analyzing Korea and Taiwan using the US patent data

Journal Article Linking the technological regime to the technological catch-up: analyzing Korea and Taiwan using the US patent data Get access Kyoo-Ho Park, Kyoo-Ho Park Keun Lee, School of Economics, Seoul National University, Seoul, 151–742, Korea. e‐mail: kenneth@snu.ac.kr Search for other works by this author on: Oxford Academic Google Scholar Keun Lee Keun Lee Search for other works by this author on: Oxford Academic Google Scholar Industrial and Corporate Change, Volume 15, Issue 4, August 2006, Pages 715–753, https://doi.org/10.1093/icc/dtl016 Published: 04 July 2006