阿累尼乌斯方程
实验数据
统计分析
计算机科学
加速寿命试验
试验数据
考试(生物学)
图形显示
试验方法
可靠性(半导体)
可靠性工程
统计
工程类
数学
活化能
热力学
化学
威布尔分布
计算机图形学(图像)
古生物学
物理
功率(物理)
有机化学
程序设计语言
生物
出处
期刊:IEEE Transactions on Electrical Insulation
[Institute of Electrical and Electronics Engineers]
日期:1971-12-01
卷期号:EI-6 (4): 165-181
被引量:125
标识
DOI:10.1109/tei.1971.299172
摘要
This is Part I of a three-part series presenting statistical methods for planning and analyzing temperature-accelerated life tests when all test units are run to failure. These methods are presented so they can be profitably used by individuals with a limited statistical background. In Part I, the Arrhenius model is described, and graphical methods for analysis of such complete data are given. In Part II, numerical methods for analysis of such data are given, and optimum and standard test plans are presented and compared. In Part III, graphical and numerical methods for comparing different products are given, and methods for assessing the validity of the data and the assumptions of the Arrhenius model are also given. These methods are illustrated throughout with accelerated life test data on insulation. While the methods are presented here with the Arrhenius model, they can be used for planning and analyzing many other accelerated life test situations.
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