杂质
材料科学
扩展X射线吸收精细结构
相(物质)
相变
锗
兴奋剂
Crystal(编程语言)
电离杂质散射
碲化物
凝聚态物理
结晶学
化学物理
吸收光谱法
硅
光学
化学
光电子学
物理
有机化学
冶金
计算机科学
程序设计语言
作者
А. И. Лебедев,I. A. Sluchinskaya
出处
期刊:Ferroelectrics
[Taylor & Francis]
日期:2004-01-01
卷期号:298 (1): 189-197
被引量:4
标识
DOI:10.1080/00150190490423561
摘要
EXAFS technique was used to study the local environment of Se, Pb, Sn, Mn and In impurity atoms in germanium telluride. These data were used to clarify the mechanisms by which the impurity influence the phase transition temperature T c . It was shown that the rate of decrease of T c in doped GeTe is determined primarily by the charge state of impurity, the type of the chemical bond between impurity and main atoms of the crystal and by the size of impurity atoms.
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