反射高能电子衍射
电子回旋共振
基质(水族馆)
氢
化学
电子衍射
等离子体
分析化学(期刊)
二次离子质谱法
等离子清洗
图层(电子)
质谱法
反射(计算机编程)
原子物理学
离子
衍射
光学
外延
地质学
程序设计语言
有机化学
计算机科学
物理
海洋学
量子力学
色谱法
作者
Naoto Kondo,Yasushi Nanishi,Masatomo Fujimoto
摘要
Surface cleaning of AlGaAs substrates by hydrogen electron cyclotron resonance (ECR) plasma is carried out. Plasma is transported to the substrate surface by a divergent magnetic field. In situ reflection high-energy electron diffraction (RHEED) observation reveals that surface cleaning of AlGaAs can be successfully performed at a temperature as low as 500°C. From secondary ion mass spectrometry (SIMS) measurements, oxygen concentrations at the interface between the AlGaAs substrate and the GaAs layer grown after plasma cleaning are found to decrease as the substrate temperature decreases. At 500°C, flat surfaces with streaked RHEED patterns and clean interfaces with neither carbon nor oxygen accumulations can be obtained by hydrogen ECR plasma cleaning.
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