Advances in Spectro‐Microscopy Methods and their Applications in the Characterization of Perovskite Materials

Abstract Perovskite materials are promising contenders as the active layer in light‐harvesting and light‐emitting applications if their long‐term stability can be sufficiently increased. Chemical and structural engineering are shown to enhance long‐term stability, but the increased complexity of the material system also leads to inhomogeneous functional properties across various length scales. Thus, scanning probe and high‐resolution microscopy characterization techniques are needed to reveal the role of local defects and the results promise to act as the foundation for future device improvements. A look at the parameter space: technique‐specific sample penetration depth versus probe size highlights a gap in current methods. High spatial resolution combined with a deep penetration depth is not yet achievable. However, multimodal measurement technique may be the key to covering this parameter space. In this perspective, current advanced spectro‐microscopy methods which have been applied to perovskite materials are highlighted.