步进电机
平版印刷术
无光罩微影
微电子
光刻
计算机科学
激光器
计算光刻
下一代光刻
材料科学
光子学
分辨率(逻辑)
十字线
光掩模
多重图案
光学
纳米技术
光电子学
电子束光刻
抵抗
物理
图层(电子)
人工智能
薄脆饼
作者
Matthias Wahl,Jeff Michelmann,Holger Sailer,Angela Schneider,Nicolas Dionisio
摘要
Laser direct write lithography using near-i-line wavelength is a very fast, versatile, and cost-effective maskless technique for fabricating microstructures, especially for prototyping and low-volume production in many fields of application, e.g. microelectronics, photonics, optical devices, and mastering. However, the resolution of this method is limited and depends on the focal length of the write lens used, which means that it is necessary to find a tradeoff between write speed and resolution. In this paper, we will optimize the resolution of i-line direct write processes by applying resolution enhancement techniques, which are well known in stepper lithography. IMS Chips and Heidelberg Instruments collaborated on tuning both process and tool performance with the goal to improve structure density and resolution.
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