材料科学
锑
硒化物
杂质
半导体
载流子寿命
纳米技术
能量转换效率
光电子学
深能级瞬态光谱
俘获
太阳能电池
冶金
硅
硒
化学
生态学
有机化学
生物
作者
Anming Mo,Feng Yang,Bingxin Yang,Wei Dang,Xiaoyang Liang,Wenjie Cao,Yingnan Guo,Tao Chen,Zhiqiang Li
标识
DOI:10.1002/adfm.202316292
摘要
Abstract Deep‐level defects in semiconductor materials usually induce carrier trapping and non‐radiative recombination. However, defects caused by unintentional contaminants in antimony selenide (Sb 2 Se 3 ) solar cells have rarely been reported. Herein, the correlation between defect properties and unintentional impurities in the Sb 2 Se 3 absorber is investigated, which is prepared by injection vapor deposition with Sb 2 Se 3 source purities ranging from 99.9% to 99.9999%. The analysis of deep‐level transient spectra reveals that an increase in impurity concentration does not result in new defect types. Nevertheless, the higher impurity level causes an increase in both the defect density and the capture cross section of the original defect. To address this challenge, defect engineering is developed to regulate the growth of the Sb 2 Se 3 absorber. This strategy completely suppresses deepest defect states E3, a mixture of intrinsic defect (Sb Se ) and impurity Si related defect. As a result, the carrier lifetime increases significantly from 0.37 to 3.4 ps. This enables to fabricate Sb 2 Se 3 solar cells with a power conversion efficiency of 10.41%. This work uncovers the characteristics of unintentional contaminant‐related defects, and provides a strategy for fabricating highly efficient Sb 2 Se 3 solar cells with low‐purity source materials.
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