材料科学
薄膜
摩尔吸收率
折射率
光谱学
熔融石英
带隙
衰减系数
光导率
透射率
分析化学(期刊)
电介质
吸收光谱法
退火(玻璃)
光电子学
光学
石英
纳米技术
复合材料
化学
物理
物理化学
色谱法
量子力学
作者
S.D. Dhruv,С. А. Шарко,P.S. Solanki,Mayur Vala,I.T. Thakker,Bharat Kataria,D.K. Dhruv
出处
期刊:Solid State Phenomena
日期:2023-10-06
卷期号:350: 115-124
摘要
The review article focuses on the growth of thin film and its characterization by UV-Vis-NIR spectroscopy. For UV-Vis-NIR spectroscopy of thin films, they are usually deposited on translucent quartz glass surfaces. The article reports the extraction of various thin film optical parameters viz., absorption coefficient (α), Urbach energy (E u ), optical band gap (E g ), refractive index (n), extinction coefficient (k), dielectric constants, dissipation factor (tanδ) and optical conductivity (σ optical ) by using optical spectra (absorption(A)/transmittance (T)/reflectance (R)). Furthermore, the effect of thin film substrate temperature (T s ) and/or thickness (d) and/or post-deposition annealing temperature (T a ) on various optical parameters is discussed in detail.
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