跨阻放大器
光电探测器
响应度
光电子学
材料科学
薄膜晶体管
半导体
紫外线
放大器
电容器
晶体管
电气工程
运算放大器
纳米技术
CMOS芯片
电压
图层(电子)
工程类
作者
Yannick Schellander,Marius Winter,Maurice Schamber,Fabian Munkes,Patrick Schalberger,Harald Kuebler,Tilman Pfau,Norbert Fruehauf
摘要
Abstract In this work, real‐time ultraviolet photodetectors are realized through metal–semiconductor–metal (MSM) structures. Amorphous indium gallium zinc oxide (a‐IGZO) is used as semiconductor material and gold as metal electrodes. The readout of an individual sensor is implemented by a transimpedance amplifier (TIA) consisting of an all‐enhancement a‐IGZO thin‐film transistor (TFT) operational amplifier and a switched capacitor (SC) as feedback resistance. The photosensor and the transimpedance amplifier are both manufactured on glass substrates. The measured photosensor possesses a high responsivity R , a low response time t R E S , and a good noise equivalent power value NEP .
科研通智能强力驱动
Strongly Powered by AbleSci AI