逐次逼近ADC
功勋
校准
还原(数学)
CMOS芯片
功率(物理)
计算机科学
功率消耗
采样(信号处理)
匹配(统计)
12位
电子工程
电容器
物理
电气工程
数学
电压
工程类
电信
探测器
统计
几何学
量子力学
计算机视觉
作者
Zhechong Lan,Li Dong,Xixin Jing,Liheng Liu,Kezhi Li,Ziyan Shen,Zhiming Li,Li Geng
标识
DOI:10.1109/apccas50809.2020.9301655
摘要
This paper presents a two-step 12-bit successive-approximation register (SAR) analog to-digital converter (ADC) with a synchronous Dynamic-Element-Matching (DEM) algorithm calibration. In the proposed two-step structure, the high-precision comparison is replaced by a low-power comparison in some conversion cycles, which can lower the power consumption of the ADC. The DEM calibration fits the 2-step structure very well and achieves a first-order mismatch shaping with negligible extra power loss. The proposed SAR ADC is fabricated in a standard 180 nm CMOS technology with a core area of 0.226 mm 2 . It consumes 9.15 μW at 200 kS/s sampling rate, resulting a power consumption reduction of 15%, and achieves a SNDR of 68.85 dB. The resulting figure of merit (FoM) is 20.13 fJ/conversion-step.
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