材料科学
光电探测器
响应度
光电子学
钝化
异质结
暗电流
吸收(声学)
红外线的
硅
比探测率
偏压
图层(电子)
光学
纳米技术
电压
物理
复合材料
量子力学
作者
Jie Mao,Bingchang Zhang,Yihao Shi,Xiaofeng Wu,Yuanyuan He,Di Wu,Jiansheng Jie,Chun‐Sing Lee,Xiaohong Zhang
标识
DOI:10.1002/adfm.202108174
摘要
Abstract 2D layered materials have attracted considerable attention for fabricating IR photodetectors. However, performance, especially for weak signal detection, of these IR photodetectors is often limited by the low absorbance of the very thin active materials as well as unsuppressed dark currents. Herein, a photodetector with high sensitivity for ultraweak IR signals based on a conformal MoS 2 /silicon nanowire array heterojunction with an ultrathin Al 2 O 3 interfacial passivation layer is reported. The conformal light‐trapping nanoarray structure can greatly enhance broadband IR absorption, while the Al 2 O 3 layer can suppress interface carrier recombination effectively and thus lower reverse dark current. The photodetectors exhibit broadband photoresponse ranging from 300 to 1600 nm, low noise current of 0.11 pA Hz −1/2 , large responsivity up to 0.61 A W −1 at zero bias voltage, and high specific detectivity of 10 11 –10 12 Jones. Significantly, the devices are capable of detecting ultraweak IR signals (e.g., 100 pW at 808 nm and 3 nW at 1310/1550 nm) with high on–off ratios without applying any external bias. This work proposes a new strategy to enhance light absorption of 2D materials and construct high‐quality junction based on them, which is promising for low‐cost and high‐performance optoelectronic devices.
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