纳米压痕
砷化镓
材料科学
分子动力学
缩进
变形(气象学)
结晶学
位错
凝聚态物理
化学物理
复合材料
化学
光电子学
计算化学
物理
作者
Yunhui Chen,Han Huang,Mingyuan Lu,Yueqin Wu,Feng Fang,X.T. Hu
出处
期刊:Applied Mechanics and Materials
[Trans Tech Publications, Ltd.]
日期:2014-05-01
卷期号:553: 60-65
被引量:2
标识
DOI:10.4028/www.scientific.net/amm.553.60
摘要
Three-dimensional molecular dynamics (3D MD) simulation was carried out to investigate the deformation of single crystal gallium arsenide (GaAs) during nanoindentation. Tersoff potential was used to simulate the atomistic interaction under an extremely low load of indentation. The coordination number and atomic displacement were studied and the cross-sectional profiles of the simulated indent were examined. The simulation results revealed that the lattice deformation of GaAs was influenced by polarity, showing distinct patterns on different crystalline planes. Slip band and dislocation were found to be the dominant deformation phenomena.
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