电压降
俄歇效应
发光二极管
材料科学
光电子学
量子效率
重组
螺旋钻
位错
量子阱
物理
化学
原子物理学
光学
量子力学
电压
复合材料
基因
生物化学
分压器
激光器
作者
Yun-Li Li,Yi-Ru Huang,Yeong‐Lin Lai
标识
DOI:10.1109/jstqe.2009.2015894
摘要
Efficiency droop behavior of InGaN/GaN multiple-quantum-well LEDs with various well thicknesses is discussed. It is demonstrated that LED samples with thinner well structures possess higher external quantum efficiencies with stronger droop behaviors. The efficiency droop behavior is contributed by dislocation recombination, Auger recombination in an active region, and carrier overflow out of an active region. Simulation results suggest that at the current density region of 10-100 A/cm 2 , Auger recombination is a dominant mechanism for efficiency droop behavior, while at high current density region of 100-200 A/cm 2 , carrier overflow starts to be the major mechanism for the change of efficiency droop behaviors.
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