合金
氢
材料科学
薄膜
氢传感器
航程(航空)
光电子学
冶金
分析化学(期刊)
钯
纳米技术
复合材料
化学
催化作用
环境化学
有机化学
作者
Durvesh Gautam,Yogendra K. Gautam,Ashwani Kumar,Sagar Vikal,Amit Sanger,Anil K. Malik,Beer Pal Singh
标识
DOI:10.1109/jsen.2024.3491793
摘要
In this study, MgPd alloy thin films were deposited on a glass substrate using dc/RF magnetron sputtering technique with varying sputtering power (30–60 W) of Pd target to achieve different compositions of alloy. X-ray diffractometry (XRD) and X-ray photoelectron spectroscopy (XPS) analyses provide the crystalline structure and elemental composition of the MgPd alloy thin films, respectively. The surface morphology study through field emission scanning electron microscopy (FE-SEM) reveals nanoflakes. Gas sensing study reveals that the sensitivity of the Mg65Pd35 alloy thin film sensor is 3.41% for 500 ppm and 13% for 1 bar of hydrogen (H2) at room temperature (RT). The response/recovery times of the sensor are 5 s/3 min and 85 s/6 min for 1 bar H2 gas and 500 ppm H2, respectively. A remarkable selectivity toward the H2 gas is observed in comparison to other gases such as CO, NO2, and NH3. Long-term stability was observed even with increased Pd composition over multiple hydrogenation/dehydrogenation cycles. These findings suggest that Pd-capped MgPd alloy thin films are promising for the applications of highly durable, selective, cost-effective, and room-temperature hydrogen gas sensors.
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