德拉姆
计算机科学
考试(生物学)
过程(计算)
钥匙(锁)
可靠性工程
嵌入式系统
计算机硬件
电子工程
工程类
操作系统
生物
古生物学
标识
DOI:10.1109/cstic61820.2024.10532065
摘要
Nowadays, AI applications is booming developing, and it has had big progress at LLM. HBM, supplying the high-bandwidth and high-speed data solution in device, is supporting it behind the scenes. Compared to traditional DRAM, HBM structure is quite different with 3D-stacked at wafer process. The memory test on HBM is becoming crisscross complicated. To lower the complexity of the test HBM should also some optimized designs. Advantest's T5833, is a key memory tester, which has a full solution on the memory repair. Combined with the ALPG and DBM, it could handle all requirements of HBM test.
科研通智能强力驱动
Strongly Powered by AbleSci AI