材料科学
退火(玻璃)
薄膜
微晶
粒度
碲化镉光电
扫描电子显微镜
表面粗糙度
表面光洁度
衍射
纳米-
真空蒸发
复合材料
光电子学
光学
纳米技术
冶金
物理
作者
Marwa Jawad Lahwd,Abbas Kasoob Jarallah
出处
期刊:Nucleation and Atmospheric Aerosols
日期:2023-01-01
摘要
The present work preparation of thin films CdTe by vacuum thermal evaporation method. The X-ray diffraction shows all films were polycrystalline structure and the crystal size increases with increase thicknesses and decrease with annealing. Atomic force microscopic (AFM) image shows decrease the roughness with increase of thickness and annealing temperature. Scanning electron microscopic (SEM) image shows thin film thicknesses and annealing temperature effects directly on grain size, Moreover the optical band gap changed by increasing the thin films thickness and decreased with increasing of annealing temperature.
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