砂纸
发射率
材料科学
表面粗糙度
表面光洁度
光学
摩尔吸收率
航程(航空)
曲面(拓扑)
波长
复合材料
几何学
数学
光电子学
物理
作者
Longfei Li,Wenyue Ruan,Weilong Wang,Kun Yu,Kaihua Zhang,Yanlei Liu,Yufang Liu
标识
DOI:10.1016/j.triboint.2023.108557
摘要
A new method was proposed to accurately predict the emissivity of rough surface polished by sandpaper. The complex rough surface was numerically reestablished based on the surface characteristic parameters extracted from the statistical data of 3D optical profiler measurement. Directional spectral emissivity of the established surface was simulated by the finite element method in the wavelength range of 2–20 µm and in the emission angle range of 0–80°. The influence of roughness on spectral emissivity was carefully studied. The calculated emissivity was compared to the data measured by a self-made emissivity measurement apparatus. The predicted results are in good agreement with the experimental data, which well proves the reliability of the proposed method.
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