光伏
热失控
二极管
热的
材料科学
可靠性(半导体)
光电子学
不稳定性
薄膜
光伏系统
机械
电气工程
物理
工程类
纳米技术
功率(物理)
电池(电)
量子力学
气象学
作者
V. G. Karpov,A. Vaško,Aarohi Vijh
摘要
We show that thin film diode structures, such as photovoltaics and light emitting arrays, can undergo zero threshold localized thermal runaway leading to thermal and electrical nonuniformities spontaneously emerging in originally uniform systems. The linear stability analysis is developed for a system of thermally and electrically coupled two discrete diodes, and for a distributed system. These results are verified with numerical modeling that is not limited to small fluctuations. The discovered instability negatively affects the device performance and reliability. It follows that these problems can be mitigated by properly designing the device geometry and thermal insulation.
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