拓扑缺陷
碳纳米管
透射电子显微镜
位错
石墨烯
材料科学
纳米技术
变形(气象学)
纳米管
碳纤维
拓扑(电路)
化学物理
凝聚态物理
复合材料
复合数
物理
组合数学
数学
作者
Kazu Suenaga,Hideaki Wakabayashi,Masanori Koshino,Yuta Sato,Koki Urita,Sumio Iijima
标识
DOI:10.1038/nnano.2007.141
摘要
A single-walled carbon nanotube (SWNT) is a wrapped single graphene layer, and its plastic deformation should require active topological defects--non-hexagonal carbon rings that can migrate along the nanotube wall. Although in situ transmission electron microscopy (TEM) has been used to examine the deformation of SWNTs, these studies deal only with diameter changes and no atomistic mechanism has been elucidated experimentally. Theory predicts that some topological defects can form through the Stone-Wales transformation in SWNTs under tension at 2,000 K, and could act as a dislocation core. We demonstrate here, by means of high-resolution (HR)-TEM with atomic sensitivity, the first direct imaging of pentagon-heptagon pair defects found in an SWNT that was heated at 2,273 K. Moreover, our in situ HR-TEM observation reveals an accumulation of topological defects near the kink of a deformed nanotube. This result suggests that dislocation motions or active topological defects are indeed responsible for the plastic deformation of SWNTs.
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